Method and system for testing multi-chip integrated circuit...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

Reexamination Certificate

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C324S761010, C324S758010

Reexamination Certificate

active

06984997

ABSTRACT:
A system and method for utilizing a multi-probe tester to test an electrical device having a plurality of contact pads. Multi-probe tester test probes and electrical device contact pads are arrayed in a common distribution pitch, wherein at least one test probe is masked, thereby preventing the at least one test probe from returning a test result to the testing apparatus. In one embodiment mask membrane physically prevents at least one test probe from making contact with the electrical device. In another embodiment at least one software command is provided configured to cause an input from at least one test probe to be disregarded during a test routine. Another embodiment features both mask membrane and software command probe masking.

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patent: 5150042 (1992-09-01), Look et al.
patent: 5206585 (1993-04-01), Chang et al.
patent: 5216358 (1993-06-01), Vaucher
patent: 5500605 (1996-03-01), Chang
patent: 6118288 (2000-09-01), Kang
patent: 6211690 (2001-04-01), Fjelstad

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