Method and system for testing multi-chip integrated circuit...

Details Method and system for testing multi-chip integrated circuit... Method and system for testing multi-chip integrated circuit...

2006-01-10

2006-01-10

Nguyen, Vinh P. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S761010, C324S758010

Reexamination Certificate

active

06984997

ABSTRACT:
A system and method for utilizing a multi-probe tester to test an electrical device having a plurality of contact pads. Multi-probe tester test probes and electrical device contact pads are arrayed in a common distribution pitch, wherein at least one test probe is masked, thereby preventing the at least one test probe from returning a test result to the testing apparatus. In one embodiment mask membrane physically prevents at least one test probe from making contact with the electrical device. In another embodiment at least one software command is provided configured to cause an input from at least one test probe to be disregarded during a test routine. Another embodiment features both mask membrane and software command probe masking.

REFERENCES:
patent: 4322682 (1982-03-01), Schadwill
patent: 4352061 (1982-09-01), Matrone
patent: 4471298 (1984-09-01), Frohlich
patent: 5150042 (1992-09-01), Look et al.
patent: 5206585 (1993-04-01), Chang et al.
patent: 5216358 (1993-06-01), Vaucher
patent: 5500605 (1996-03-01), Chang
patent: 6118288 (2000-09-01), Kang
patent: 6211690 (2001-04-01), Fjelstad

Affiliated with

Also associated with

Rating

Method and system for testing multi-chip integrated circuit... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and system for testing multi-chip integrated circuit..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and system for testing multi-chip integrated circuit... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3572422