Method and system for testing memory utilizing specific bit patt

Details Method and system for testing memory utilizing specific bit patt Method and system for testing memory utilizing specific bit patt

1994-06-14

1996-07-30

Nguyen, Hoa T.

Excavating

371 27, G11C 2900, G01R 3128

Patent

active

055419429

ABSTRACT:
An improved method for testing computer memory is provided. In a preferred embodiment of the present invention, copies of a bit pattern are written throughout memory until the memory is filled. The contents of the memory are read and compared to the bit patted to determine memory errors. In a preferred embodiment, the bit pattern consists of a sequence of groups of bytes. The groups of bytes have a variable number of bytes. Each group in the sequence alternates between all 1s and all 0s with the last group of the sequence containing a combination of 1s and 0s.

REFERENCES:
patent: 4195770 (1980-04-01), Benton et al.
patent: 4528634 (1985-07-01), Nakahata et al.

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