Method and system for testing image sensor system-on-chip

Details Method and system for testing image sensor system-on-chip Method and system for testing image sensor system-on-chip

2006-08-01

2006-08-01

Bella, Matthew C. (Department: 2623)

Image analysis

Applications

Manufacturing or product inspection

C382S312000, C250S208100, C356S237100

Reexamination Certificate

active

07085408

ABSTRACT:
Methods and systems for testing an image sensor system-on-chip (SOC). For testing an image sensor SOC that integrates a sensor array and an image processing component, defects are being searched separately in the sensor array and the image processing component in order to isolate possible defects of the sensor array from the possible defects of the image processing component. In so doing, the location of the defects can be pin-pointed.

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patent: 6188785 (2001-02-01), Nakamura et al.
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patent: 6541751 (2003-04-01), Bidermann
patent: 6661515 (2003-12-01), Worster et al.
patent: 6726103 (2004-04-01), Motta et al.

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