Optics: measuring and testing – By polarized light examination – With polariscopes
Patent
1996-01-31
2000-02-22
Hantis, K. P.
Optics: measuring and testing
By polarized light examination
With polariscopes
G01J 400
Patent
active
060286717
ABSTRACT:
A method and system are provided for suppressing or filtering multiple reflections which corrupt photometric (grey scale or color) or height measurements within optical systems such as imaging systems. The reflections may originate within the instrument (i.e. back reflections) or may be inter-reflections between one or more surfaces in a scene. In one embodiment, a beam of electromagnetic energy generated by a source is polarized in a first rotational sense, is transmitted to a point of interest (i.e., scene) of an object, is reflected and received by a receiver having a polarizer which passes reflected electromagnetic energy having a second rotational sense opposite the first rotational sense. In this way, unwanted reflections from the point of interest having the first rotational sense are suppressed and back-reflections to the source of electromagnetic energy are substantially eliminated. In another embodiment, a detector which normally back-reflects a portion of electromagnetic energy it receives along a first axis, has a surface normal which is maintained in a fixed, non-colinear relation to the first axis and back-reflected electromagnetic energy is prevented from reaching the scene and, consequently, is not received by any other detector of the imaging system. The method and system are particularly well suited for use in 3D imaging systems and measurement systems utilizing a beam of electromagnetic energy and multiple detectors.
REFERENCES:
patent: 3443072 (1969-05-01), Mori
patent: 3502888 (1970-03-01), Stites
patent: 4339660 (1982-07-01), Buchholz et al.
patent: 4529316 (1985-07-01), DiMatteo
patent: 4553844 (1985-11-01), Nakagawa et al.
patent: 4634879 (1987-01-01), Penney
patent: 4643578 (1987-02-01), Stern
patent: 4645917 (1987-02-01), Penney et al.
patent: 4796997 (1989-01-01), Svetkoff et al.
patent: 4891772 (1990-01-01), Case et al.
patent: 4967152 (1990-10-01), Patterson
patent: 5024529 (1991-06-01), Svetkoff et al.
patent: 5028138 (1991-07-01), Wolff
patent: 5118191 (1992-06-01), Hopkins
patent: 5118192 (1992-06-01), Chen et al.
patent: 5850284 (1998-12-01), Schoeffler et al.
Polarization-based Peak Detection in Laser Triangulation Range Sensors, J. Clark & E. Trucco, Dept. of Computing and Electrical Engineering, Heriot-Warr University, Edinburgh, Jan., 1996.
Improving Laser Triangulation Sensors Using Polarization, J. Clark, E. Trucco, H.F. Cheung, Department of Computing and Electrical Engineering, Heriot-Watt University, Edinburgh, Scotland, Aug. 1995.
Computer Vision Systems, "Recovering Intrinsic Scene Characteristics from Images", Computer and Information Science Department, University of Massachusetts, Amherst, Masssachusetts, Jun. 1977, pp. 3-26.
The Infrared Handbook, Office of Naval Research, Department of Navy, 1978, pp. 19-22 and 19-23.
Understanding Image Intensities, Artificial Intelligence, pp. 201-231. Aug. 1977.
Fundamentals of Optics, 4th Edition 1996 pp. 534-540.
Kilgus Donald B. T.
Svetkoff Donald J.
General Scanning Inc.
Hantis K. P.
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