Method and system for supporting negative testing in...

Details Method and system for supporting negative testing in... Method and system for supporting negative testing in...

2005-08-09

2005-08-09

Wachsman, Hal (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system

Performance or efficiency evaluation

C702S119000, C702S120000, C702S124000, C714S038110, C703S022000, C717S124000

Reexamination Certificate

active

06928393

ABSTRACT:
Provided is a system and method for black-box testing of software using positive and negative test cases with N-way combinations of parameter values. An original model comprising valid and invalid values is modified in a first phase, by generating exclusions (constraints) for pairs of invalid values. A first suite of test cases is generated from the modified model, and positive test cases eliminated, creating a first test suite with only negative tests. In a second phase, the original model is modified by eliminating invalid values, from which a second test suite having only positive test cases for all valid N-way combinations is generated. Merging the two test suites provides a suite of positive and negative test cases that test software with N-way combinations of values, in which each negative test case has only one invalid value.

REFERENCES:
patent: 5784553 (1998-07-01), Kolawa et al.
patent: 5812436 (1998-09-01), Desgrousilliers et al.
patent: 6321376 (2001-11-01), Willis et al.

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