Method and system for spectroscopic data analysis

Details Method and system for spectroscopic data analysis Method and system for spectroscopic data analysis

2011-07-12

2011-07-12

Evans, F. L (Department: 2877)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Chemical analysis

C250S307000, C250S310000

Reexamination Certificate

active

07979217

ABSTRACT:
A method of analyzing spectroscopic data, the method comprising collecting spatially resolved measurement spectroscopic data of a sample for a series of measurements spots, assigning the measurement spots into a predefined set of spectral categories, based on characteristics of the spectroscopic data of the respective measurement spots, identifying groupings of the measurement spots based on their respective spectral categories and their spatial relationships, and assigning each grouping of measurement spots to a fundamental sample unit data object.

REFERENCES:
patent: 4037101 (1977-07-01), Okumura et al.
patent: 4476386 (1984-10-01), Reid et al.
patent: 4592082 (1986-05-01), Pawloski
patent: 4839516 (1989-06-01), Freeman et al.
patent: 5555198 (1996-09-01), Asano
patent: 5741707 (1998-04-01), Herron et al.
patent: 5798525 (1998-08-01), Benizri-Carl et al.
patent: 5866903 (1999-02-01), Morita et al.
patent: 5906919 (1999-05-01), Garini et al.
patent: 5991028 (1999-11-01), Cabib et al.
patent: 6018587 (2000-01-01), Cabib
patent: 6066459 (2000-05-01), Garini et al.
patent: 6122343 (2000-09-01), Pidcock
patent: 6282301 (2001-08-01), Haskett
patent: 6341257 (2002-01-01), Haaland
patent: 6377652 (2002-04-01), Sturm
patent: 6466929 (2002-10-01), Brown et al.
patent: 6470335 (2002-10-01), Marusak
patent: 6584413 (2003-06-01), Keenan et al.
patent: 6658143 (2003-12-01), Hansen et al.
patent: 6674894 (2004-01-01), Parker et al.
patent: 6687620 (2004-02-01), Haaland et al.
patent: 6711503 (2004-03-01), Haaland
patent: 6724940 (2004-04-01), Qian et al.
patent: 6842702 (2005-01-01), Haaland et al.
patent: 6993170 (2006-01-01), Johnson et al.
patent: 7139415 (2006-11-01), Finkbeiner
patent: 7161672 (2007-01-01), Gornushkin et al.
patent: 7400770 (2008-07-01), Keaton et al.
patent: 7436510 (2008-10-01), Grun et al.
patent: 7490009 (2009-02-01), Gottlieb et al.
patent: 2002/0169589 (2002-11-01), Banki et al.
patent: 2004/0027350 (2004-02-01), Kincaid et al.
patent: 2004/0147830 (2004-07-01), Parker et al.
patent: 2005/0037515 (2005-02-01), Nicholson et al.
patent: 2006/0291619 (2006-12-01), Statham
patent: 2007/0279629 (2007-12-01), Grun et al.
patent: 1601261 (2005-03-01), None
patent: 08015185 (1996-01-01), None
patent: 2000249668 (2000-09-01), None
patent: 2001066269 (2001-03-01), None
patent: 2002189005 (2002-07-01), None
patent: 2054660 (1996-02-01), None
patent: 9905503 (1999-02-01), None
patent: 2009100404 (2009-08-01), None
Sutherland, David N., “Image Analysis for Off-Line Characterisation of Mineral Particles and Prediction of Processing Properties,” Part. Part. Syst. Charact., 1993, pp. 271-274, vol. 10.
Benz, Ursula C. et al., “Multi-resolution, Object-oriented Fuzzy Analysis of Remote Sensing Data for GIS-ready Information,” ISPRS Journal of Photogrammetry & Remote Sensing, 2004, pp. 239-258, vol. 58.
Creelman, Robert A. et al., “A Scanning Electron Microscope Method for Automated, Quantitative Analysis of Mineral Matter in Coal,” International Journal of Coal Geology, 1996, pp. 249-269, vol. 30.
Gottlieb, P. et al., “The Automatic Identification and Quantification of Silver Minerals,” XVIII International Mineral Processing Congress, May 23-28, 1993, pp. 475-481, Sydney, Australia.
Gottlieb, P. et al., “Using Quantitative Electron Microscopy for Process Mineralogy Applications,” Microtextural Mineralogy, Apr. 2000, pp. 24-25.
Hazel, Geoffrey G. et al., “Object-level Processing of Spectral Imagery for Detection of Targets and Changes Using Spatial-Spectral-Temporal Techniques,” Proceeding of the SPIE, 2001, pp. 381-390, vol. 4381.
Newbury, Dale E., “Chemical Compositional Mapping by Microbeam Analysis at the Micrometer Scale and Finer,” Microelectronics Journal, 1997. pp. 489-508, vol. 28.
Sutherland, D.N. et al., “Application of Automated Quantitative Mineralogy in Mineral Processing,” Minerals Engineering, 1991, pp. 753-762, vol. 4, Nos. 7-11.
Ghassemian, Hassan et al., “Object-Oriented Feature Extraction Method for Image Data Compaction,” IEEE Control Systems Magazine, Jun. 1998, pp. 42-48.
Ashton, Edward A. et al., “Multialgorithm Solution for Automated Multispectral Target Detection,” Opt. Eng., Apr. 1999, pp. 717-724, vol. 38, No. 4.

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