Method and system for selectively loading test data into test da

Details Method and system for selectively loading test data into test da Method and system for selectively loading test data into test da

1982-08-18

1985-01-08

Smith, Jerry

Excavating

371 20, G06F 1100

Patent

active

044930798

ABSTRACT:
A method and system for loading test data into individual pin memories of an automatic digital test system, particularly of the in-circuit type. Test data in the form of test vectors are accessed from a test vector store simultaneously with the access of a digital test pin selection signal. The test pin selection signal accessed with the test data is then used to selectively load the test data into a pin memory identified by the pin selection signal, thereby permitting the loading of test data into any one of a group of individual pin memories. In the preferrred embodiment the test data, a test vector, is stored in a test vector store in association with a test pin selection signal. When the test vector is read from memory, the test pin selection signal is also read by the same address signal.

REFERENCES:
patent: 4108358 (1978-08-01), Niemaszyk et al.
patent: 4402081 (1983-07-01), Ichimiya et al.
patent: 4433414 (1984-02-01), Carey

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