Method and system for reducing device test time

Details Method and system for reducing device test time Method and system for reducing device test time

2011-04-19

2011-04-19

Bui, Bryan (Department: 2857)

Data processing: measuring, calibrating, or testing

Testing system

Including program set up

C714S724000

Reexamination Certificate

active

07930130

ABSTRACT:
A system and method for reducing device test time are disclosed herein. A method for reducing device test time includes applying a linear program solver to select a first set of tests for testing a device from a second set of tests for testing the device. The first set of tests is selected to reduce the time required to test the device while allowing no more than a predetermined number of devices tested to pass the first set of tests and fail the second set of tests.

REFERENCES:
patent: 2002/0049941 (2002-04-01), Lunde et al.
patent: 2003/0196139 (2003-10-01), Evans
patent: 2006/0267577 (2006-11-01), Erez et al.

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