Method and system for reading the resistance state of...

Details Method and system for reading the resistance state of... Method and system for reading the resistance state of...

2008-03-04

2008-03-04

Barlow, John (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

Reexamination Certificate

active

07340356

ABSTRACT:
Various embodiments of the present invention are directed to methods for determining the resistance state of nanowire-crossbar junctions, and can also be used to determine the resistance state of sub-microscale crossbar junctions. A pair of wires interconnected through the crossbar junction is biased to determine a first signal for the crossbar junction. The pair of wires interconnected through the crossbar junction is then biased again to increase the resistance of the crossbar junction. The pair of wires interconnected through the crossbar junction is then biased again to determine a second signal for the crossbar junction. The first signal is compared to the second signal to determine the resistance state of the crossbar junction.

REFERENCES:
patent: 2004/0041617 (2004-03-01), Snider et al.
patent: 2004/0223352 (2004-11-01), Snider
patent: 2005/0117441 (2005-06-01), Lieber et al.

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