Method and system for processing stability of semiconductor...

Details Method and system for processing stability of semiconductor... Method and system for processing stability of semiconductor...

2005-11-15

2005-11-15

Barlow, John (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system

Statistical measurement

Reexamination Certificate

active

06965844

ABSTRACT:
A method and system for processing stability of semiconductor devices. The method includes providing a first plurality of semiconductor devices, providing a second plurality of semiconductor devices, obtaining a first plurality of measured values corresponding to a characteristic, and obtaining a second plurality of measured values corresponding to the characteristic. Additionally, the method includes performing a first statistical analysis for the first plurality of measured values, determining a first statistical distribution, performing a second statistical analysis for the second plurality of measured values, and determining a second statistical distribution. Moreover, the method includes processing information associated with the first statistical distribution and the second statistical distribution, and determining an indicator. Also, the method includes processing information associated with the indicator, determining a confidence level, processing information associated with the confidence level, and determining whether the characteristic is stable.

REFERENCES:
patent: 6792386 (2004-09-01), Dobson
patent: 2003/0229462 (2003-12-01), Wang
Wang, “Sameness-An Equivalency Index of Products, Processes and Services,” 2002 Hawaii International Conference on Statistics, Jun. 5-9, 2002, 5 pages total.

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