Abrading – Abrading process – Utilizing fluent abradant
Reexamination Certificate
2006-12-05
2006-12-05
Rose, Robert A. (Department: 3723)
Abrading
Abrading process
Utilizing fluent abradant
C451S041000
Reexamination Certificate
active
07144301
ABSTRACT:
For planarizing an IC (integrate circuit) material, a first slurry is dispensed for a first planarization of the IC material using the first slurry, and a second slurry is dispensed for a second planarization of the IC material using the second slurry. The first and second slurries are different. For example, the first slurry is silica based for faster planarization during the first planarization. Thereafter, the second planarization is performed with the second slurry that is ceria based with higher planarity for attaining sufficient planarization of the IC material.
REFERENCES:
patent: 5676587 (1997-10-01), Landers et al.
patent: 5851135 (1998-12-01), Sandhu et al.
patent: 6203404 (2001-03-01), Joslyn et al.
patent: 6213852 (2001-04-01), Fujii et al.
patent: 6468910 (2002-10-01), Srinivasan et al.
patent: 6561876 (2003-05-01), Tateyama et al.
patent: 6604987 (2003-08-01), Sun
Korean Patent Application No. 20000027503 to Boo et al., having Application date of May 22, 2000 (w/ English Abstract page).
Japanese Patent No. JP2001009702 to Tomoyuki et al., having Publication date of May 13, 2003 (w/ English Abstract page).
Korean Patent Application No. 10-1997-0017792 to Scherber et al., having Publication date of Dec. 10, 1997 (w/ English Abstract page).
Korean Patent Application No. 10-1999-0019826 to Kim et al., having Publication date of Dec. 15, 2000 (w/ English Abstract page).
Choi Jae-Kwang
Hong Chang-Ki
Kim Kwang-Bok
Kim Kyung-Hyun
Ko Yong-Sun
Choi Monica H.
Rose Robert A.
LandOfFree
Method and system for planarizing integrated circuit material does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and system for planarizing integrated circuit material, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and system for planarizing integrated circuit material will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3716328