Method and system for physicochemical analysis using a laser...

Optics: measuring and testing – By dispersed light spectroscopy – With sample excitation

Reexamination Certificate

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C356S317000, C356S318000

Reexamination Certificate

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07944558

ABSTRACT:
A method for physicochemical analysis of a material during its ablation with a pulsed laser. The method uses the ratio of intensity levels of two emission lines of a tracer element derived from plasma generated by the laser beam to characterize the plasma excitation temperature. The method determines concentration of an element to be measured in the plasma using standard measurements indicating correspondence between a concentration of the element to measured and a variation of intensity of an emission line and different ratios between intensity levels of two emission lines of the tracer element, the ratios representing the plasma temperature.

REFERENCES:
patent: 4690558 (1987-09-01), Tsunoyama et al.
patent: 5715053 (1998-02-01), Loge
patent: 5991020 (1999-11-01), Loge
patent: 6008896 (1999-12-01), Sabsabi et al.
patent: WO 99/49301 (1999-09-01), None
C. Chaleard, et al., “Correction of Matrix Effects in Quantitative Elemental Analysis With Laser Ablation Optical Emission Spectrometry”, Journal of Analytical Atomic Spectrometry, XP 009019037, vol. 12, No. 2, Feb. 1997, pp. 183-188.

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