Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Logic design processing
Reexamination Certificate
2008-06-20
2011-12-27
Siek, Vuthe (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Integrated circuit design processing
Logic design processing
Reexamination Certificate
active
08086978
ABSTRACT:
A method, system, and computer program product are disclosed for performing statistical leakage power characterization to estimate yield of a circuit in terms of leakage power. According to some approaches, this is performed with consideration of state correlation.
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Chang Hongliang
Gerousis Vassilios
Khurana Parveen
Shrivastava Sachin
Zhang Lizheng
Bowers Brandon
Cadence Design Systems Inc.
Siek Vuthe
Vista IP Law Group LLP
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