Radiation imagery chemistry: process – composition – or product th – Post imaging processing – Physical developing
Patent
1995-06-06
1997-10-21
Teska, Kevin J.
Radiation imagery chemistry: process, composition, or product th
Post imaging processing
Physical developing
430311, 430313, 430316, H01L 2131
Patent
active
056805888
ABSTRACT:
A method and system for finding and setting the illumination in a projection imaging system to achieve optimum imaging. The global optimum illumination is found based on the desired characteristics of the image irradiance distribution as embodied in a target aerial image. The system employs an optimization algorithm that finds the best combination of projected mask images, each such image formed by directing source illumination to selected regions (e.g., pixels) in the entrance pupil (each such region location and size corresponding to a nominal illumination direction and a particular range of angles about the nominal). The optimum illumination is defined as that illumination which produces an aerial image closest to the predefined target aerial image. The system then sets the illuminator to produce the source distribution necessary to achieve this optimal illumination. The set of aerial images created by addressing the available entrance pupil regions with illumination is determined either by numerical calculation or by scanning and recording the individual aerial images produced by the projection system.
REFERENCES:
patent: 4241389 (1980-12-01), Heimer
patent: 4348105 (1982-09-01), Caprari
patent: 4560235 (1985-12-01), Servaes et al.
patent: 4819033 (1989-04-01), Yoshitake et al.
patent: 4869999 (1989-09-01), Fukuda et al.
patent: 4890239 (1989-12-01), Ausschnitt et al.
patent: 4929083 (1990-05-01), Brunner
patent: 4947413 (1990-08-01), Jewell et al.
patent: 5137363 (1992-08-01), Kosugi et al.
patent: 5142132 (1992-08-01), MacDonald et al.
patent: 5202748 (1993-04-01), MacDonald et al.
patent: 5300786 (1994-04-01), Brunner et al.
patent: 5326659 (1994-07-01), Liu et al.
patent: 5340700 (1994-08-01), Chen et al.
patent: 5363170 (1994-11-01), Muraki
patent: 5415835 (1995-05-01), Brueck et al.
patent: 5447810 (1995-09-01), Chen et al.
patent: 5559338 (1996-09-01), Elliott et al.
M. Noguchi et al., "Sub-half micron lithography system with phase-shifting effect," SPIE Proceedings, vol. 1671-Optical/Laser Microlithography I, J. Cuthbert, Ed. (Society of Photo-Optical Instrumentation Engineers, Bellingham, WA, 1992), pp. 92-104.
Douglas Goodman, "Optics of Photolithography", Optical Society of America, OptCon Meeting, Santa Clara, California, 1988, pp. 112-117.
Parlo, Fields, and Oldham, "Direct Aerial Image Measurement as a Method of Testing High Numerical Aperture Microlithographic Lenses", 37th International Symposium on Electron, Ion, and Photon Beams, San Diego, California, in Jun. 1993.
H. H. Hopkins, "Image Formation with Coherent and Partially Coherent Light," Photographic Science and Engineering, vol. 21, #3, May/Jun. 1977, p. 114.
D.G. Flagello and A.E. Rosenbluth, "Vector Diffraction Analysis of Phase-mask Imaging into Photoresist," SPIE 1993 Microlithography Conference, San Jose, CA, 1993.
IBM's Optimization Subroutine Library(OSL), IBM Systems Journal, vol. 31, No. 1, 1992(IBM publication #sc23-0519-03).
M. Avriel, Non-linear Programming, Prentice Hall, 1976.
T. Brunner, "Rim Phase-Shift Mask Combined with Off-Axis Illumination: a Path to 0.5.lambda./NA Geometries," SPIE Proceedings, vol. 1927--Optical/Laser Microlithography, J. Cuthbert, Ed. (Society of Photo-Optical Instrumentation Engineers, Bellingham, WA, 1993), pp. 54-62.
H. Sewell, "A New Dimension in Phase-Shift Mask Technology," SPIE Microlithography 1993, San Jose, CA.
H. Jinbo and Y. Yamashita, "0.2 Micron or Lessi-line Lithography by Phase-Shifting Mask Technology," IEDM 1990 Technical Digest, p. 825, IEEE, 1990.
P.H. Berning, Physics of Thin Films, G. Hass. Ed. (Academic Press 1963), pp. 69-121.
R. Fletcher, Practical Methods of Optimization, vol. 2, Contrained Optimization Wiley, 1981.
Gortych Joseph Edward
Rosenbluth Alan Edward
Frejd Russell W.
International Business Machines - Corporation
Meier Lawrence H.
Shkurko Eugene I.
Teska Kevin J.
LandOfFree
Method and system for optimizing illumination in an optical phot does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and system for optimizing illumination in an optical phot, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and system for optimizing illumination in an optical phot will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1015055