Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2008-04-29
2008-04-29
Chawan, Sheela (Department: 2624)
Image analysis
Applications
Manufacturing or product inspection
C264S177120, C264S630000, C356S237600, C428S116000, C428S593000
Reexamination Certificate
active
10873942
ABSTRACT:
A method and system for inspecting a honeycomb structure having a plurality of parallel channels includes aligning the honeycomb structure with an image sensing device such that the channels of the honeycomb structure are tilted with respect to the parallel channels of the honeycomb structure. An image of the honeycomb structure is then acquired. The image is processed in order to determine the perpendicularity of the end surface of the honeycomb structure.
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patent: 2001/0028452 (2001-10-01), Yoneda
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patent: 2004/0013582 (2004-01-01), Ichikawa et al.
patent: 2005/0100486 (2005-05-01), Ichikawa et al.
Chawan Sheela
McKee Voorhees & Sease, P.L.C.
Reflect Scientific (DBA) Miralogix
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