Method and system for offset estimation and alignment

Details Method and system for offset estimation and alignment Method and system for offset estimation and alignment

2006-10-20

2010-06-08

Werner, Brian P (Department: 2624)

Image analysis

Applications

Manufacturing or product inspection

C382S289000

Reexamination Certificate

active

07734084

ABSTRACT:
A method for determining an offset vector. The method includes obtaining an image of a first feature. An image of a second feature is also obtained. Also, a combination image of the first feature and the second feature is obtained. A plurality of composite images is utilized to determine an accurate offset vector between the first feature and the second feature in the combination image. The plurality of composite images is based on the image of the first feature and the image of the second feature.

REFERENCES:
patent: 4547800 (1985-10-01), Masaki
patent: 5251271 (1993-10-01), Fling
patent: 5434956 (1995-07-01), Son et al.
patent: 5640200 (1997-06-01), Michael
patent: 5643699 (1997-07-01), Waldner
patent: 5809171 (1998-09-01), Neff et al.
patent: 6068954 (2000-05-01), David
patent: 6259525 (2001-07-01), David
patent: 7085673 (2006-08-01), Picciotto et al.
patent: 7095885 (2006-08-01), DeLaRosa et al.
patent: 7226797 (2007-06-01), Tong et al.
patent: 2006/0110069 (2006-05-01), Tong et al.

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