Method and system for non-invasive power transistor die...

Details Method and system for non-invasive power transistor die... Method and system for non-invasive power transistor die...

2005-03-01

2005-03-01

Cuneo, Kamand (Department: 2829)

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

Plural inputs

C324S1540PB

Reexamination Certificate

active

06861835

ABSTRACT:
A non-invasive, non-destructive method and system for determining power transistor peak die voltage utilizes values for each of a plurality of parameters determined by measurement of external terminal voltages for any number of switches, such as transistors of an inverter. Stray inductance values are calculated and used with measured current gradient to calculate the peak die voltages for the switches. A refinement of the method determines transistor peak die voltage without measuring current.

REFERENCES:
patent: 4910416 (1990-03-01), Salcone
patent: 5426350 (1995-06-01), Lai
patent: 5864211 (1999-01-01), Kiermeier
patent: 6091288 (2000-07-01), Moisin
patent: 6448720 (2002-09-01), Sun
patent: 6469919 (2002-10-01), Bennett
patent: 6486714 (2002-11-01), Ushida et al.

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