Method and system for modeling uncertainties in integrated...

Data processing: structural design – modeling – simulation – and em – Modeling by mathematical expression

Reexamination Certificate

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C703S013000

Reexamination Certificate

active

07920992

ABSTRACT:
A method and system for modeling uncertainties in integrated circuits, systems and fabrication processes may include defining interval values for each uncertain component or parameter in a circuit or system. The method may also include replacing scalar operations with interval operations in an algorithm and discontinuing interval operations in the algorithm in response to a predetermined condition. The method may also include generating a plurality of scalar samples from a plurality of intervals and determine a distribution of each uncertain component or parameter from the scalar samples of the intervals.

REFERENCES:
patent: 2004/0243375 (2004-12-01), Kundert
Harkness, Cheryl L., et al., Interval Methods for Modeling Uncertainty in RC Timing Analysis, IEEE Transactions on Computer-Aided Design, vol. 11, No. 11, pp. 1388-1401, Nov. 1992.
Visweswariah, C., et al., First-Order Incremental Block-Based Statistical Timing Analysis, pp. 331-336, (2004).
Shi, Richard, C.-J., et al., Simulation and Sensitivity of Linear Analog Circuits Under Parameter Variations by Robust Interval Analysis, ACM Transactions on Design Automation of Electronic Systems, vol. 4, No. 3, pp. 280-312, Jul. 1999.
Stolfi, J. and De Figueiredo, L.H., “Self-Validating Numerical Methods and Applications,” in Brazilian Mathematics Colloquium Monograph, IMPA, Rio De Janeiro, Brazil, 1997. 121 pages.
Fang, C.F., “Probabilistic Interval-Valued Computation: Representing and Reasoning About Uncertainty in DSP and VLSI Designs,” Ph.D. disseratation, Department of Electrical and Computer Engineering, Carnegie Mellon University, Pittsburgh, PA, 2005. 200 Pages.
Ma, J.D. and Rutenbar, R.A., “Interval-Valued Reduced Order Statistical Interconnect Modeling”, in Proc. Int. Conf. Computer Aided Design, 2004, pp. 460-467.

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