Image analysis – Applications – Mail processing
Reexamination Certificate
2008-07-01
2008-07-01
Nguyen, Long (Department: 4193)
Image analysis
Applications
Mail processing
C382S286000
Reexamination Certificate
active
07394915
ABSTRACT:
A system and method for determining the thickness of a mail piece is provided. A first image of at least a portion of a surface of a mail piece is captured using a first optical axis for a feature on the surface of the mail piece. A second image of the feature is captured after the mail piece has moved a distance using a second optical axis that is angled with respect to the first optical axis. The first and second images are correlated to determine a displacement of the feature, and the thickness of the mail piece is determined based on the displacement and the angle between the first and second optical axes.
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Braun John F
Cordery Robert A
Ryan, Jr. Frederick W
Sansone Ronald P
Banh David H
Chaclas Angelo N.
Lemm Brian A.
Nguyen Long
Pitney Bowes Inc.
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