Method and system for measuring optical distortion

Details Method and system for measuring optical distortion Method and system for measuring optical distortion

1996-10-15

1998-09-22

Font, Frank G.

Optics: measuring and testing

Inspection of flaws or impurities

Transparent or translucent material

G01N 2100

Patent

active

058122605

ABSTRACT:
A system and method for measuring a level of optical distortion in a transparent material in accordance with the present invention includes an image capturing device, a section with a pattern of substantially uniform features, and a processing system which operates on software programmed in a memory in the processing system. The method for measuring the level of optical distortion stored in the memory comprises the steps of: inputting image signals of an image of a pattern of substantially uniform features as captured through the transparent material to a processing system; generating one or more parameter signals from the measurements of one or more parameters in each of the features in the image using the image signals; generating image area signals for each of the features in the image in response to the parameter signals, the image area signals representative of the area in each of the features in the image; generating a result signal in response to the image area signals for each of the features in the image.

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