Dynamic magnetic information storage or retrieval – Monitoring or testing the progress of recording
Reexamination Certificate
2011-07-19
2011-07-19
Mercedes, Dismery E (Department: 2627)
Dynamic magnetic information storage or retrieval
Monitoring or testing the progress of recording
C360S075000, C360S077020
Reexamination Certificate
active
07982989
ABSTRACT:
A method for measuring a magnetic interference width for a magnetic recording head is described. The method includes writing a first track at a first frequency on a magnetic disk, writing a second track at the first frequency on the magnetic disk, and writing a third track at a second frequency on the magnetic disk between the first track and the second track. The third track partially overlaps both the first track and the second track and the second frequency is different from the first frequency. The method further includes measuring a readback profile across the first, second and third tracks on the magnetic disk.
REFERENCES:
patent: 4513333 (1985-04-01), Young et al.
patent: 4516165 (1985-05-01), Cunningham et al.
patent: 5600500 (1997-02-01), Madsen et al.
patent: 5687036 (1997-11-01), Kassab
patent: 5691857 (1997-11-01), Fitzpatrick et al.
patent: 5812337 (1998-09-01), Tanaka et al.
patent: 6028731 (2000-02-01), Bond
patent: 6101053 (2000-08-01), Takahashi
patent: 6252731 (2001-06-01), Sloan et al.
patent: 6265868 (2001-07-01), Richter
patent: 6445521 (2002-09-01), Schaff et al.
patent: 6476992 (2002-11-01), Shimatani
patent: 6525892 (2003-02-01), Dunbar et al.
patent: 6680609 (2004-01-01), Fang et al.
patent: 6791775 (2004-09-01), Li et al.
patent: 6870697 (2005-03-01), Ikekame et al.
patent: 6909566 (2005-06-01), Zaitsu et al.
patent: 6914738 (2005-07-01), Fujiwara et al.
patent: 6995933 (2006-02-01), Codilian et al.
patent: 7095577 (2006-08-01), Codilian et al.
patent: 7119537 (2006-10-01), Che et al.
patent: 7203023 (2007-04-01), Kuroda et al.
patent: 7529050 (2009-05-01), Shen et al.
patent: 7567397 (2009-07-01), Lu
patent: 7667933 (2010-02-01), Kudo et al.
patent: 7706096 (2010-04-01), Ito et al.
patent: 7729071 (2010-06-01), Harada
patent: 7843658 (2010-11-01), Kiyono
patent: 2004/0010391 (2004-01-01), Cheng-I Fang et al.
patent: 2004/0075931 (2004-04-01), Kim et al.
patent: 2004/0080845 (2004-04-01), Yeo et al.
patent: 2006/0098318 (2006-05-01), Feng
Shi Changqing
Terrill David D.
Wong Jimmy
Mercedes Dismery E
Western Digital (Fremont) , LLC
LandOfFree
Method and system for measuring magnetic interference width does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and system for measuring magnetic interference width, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and system for measuring magnetic interference width will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2668411