Method and system for measuring Kerr rotation of magneto-optical

Details Method and system for measuring Kerr rotation of magneto-optical Method and system for measuring Kerr rotation of magneto-optical

1996-08-27

1997-12-02

Huber, Paul W.

Dynamic information storage or retrieval

Specific detail of information handling portion of system

Radiation beam modification of or by storage medium

369124, 356369, G11B 700, G01J 400

Patent

active

056943849

ABSTRACT:
First and second linearly polarized beams of light are incident on a magneto-optical disc at a common point. Both beams have equal or nearly equal intensity. Upon specular reflection from the disc, the first and second reflected beams travel through analyzers which are the same linear polarizers which originally polarized the second and first beams, respectively. The polarizers have an orientation such that the polarization angle between the first beam and the first polarizer is the same as the polarization angle between the second beam and the second polarizer. Consequently, the difference between the intensities of the two analyzed beams is proportional to Kerr rotation and independent of the direction of the stress axes of the magneto-optical disc substrate, and only mildly dependent on the magnitude of the retardation of the substrate.

REFERENCES:
patent: 5119352 (1992-06-01), Bell, Jr.
patent: 5202860 (1993-04-01), Takahashi et al.
"Ellipsometric Measurement of Magneto-Optical Kerr Rotation at Normal Incidence", By: Shiu Chao, et al. J. Appl. Phys. 67 (9), 1 May 1990, pp. 4241-4243.

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