Method and system for measurement of a cutting tool

Optics: measuring and testing – Shape or surface configuration

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C356S607000

Reexamination Certificate

active

07876454

ABSTRACT:
A method for measurement of a cutting tool is provided. The method comprises positioning the cutting tool on a moveable stage, performing a first rotary scan of a first section of the cutting tool to generate a first scanning point cloud, segmenting the first scanning point cloud, performing a second rotary scan of the first section based on the segmentation of the first scanning point cloud, and extracting the parameters of the first section based on the second rotary scan of the first section. A system for extracting parameters of a cutting tool is also presented.

REFERENCES:
patent: 3692414 (1972-09-01), Hosteman et al.
patent: 3710128 (1973-01-01), Kubisiak
patent: 4583854 (1986-04-01), Lozar
patent: 4736247 (1988-04-01), Graham et al.
patent: 4745290 (1988-05-01), Frankel et al.
patent: 4966460 (1990-10-01), Kahley
patent: 5477371 (1995-12-01), Shafir
patent: 5568260 (1996-10-01), Schneiter
patent: 5570186 (1996-10-01), Satzger et al.
patent: 5708279 (1998-01-01), Cheng
patent: 5846081 (1998-12-01), Bushway
patent: 6788807 (2004-09-01), Norita et al.
patent: 6927863 (2005-08-01), Gurny
patent: 7027145 (2006-04-01), Segall et al.
patent: 2002/0154396 (2002-10-01), Overbeck
patent: 2004/0263863 (2004-12-01), Rogers et al.
patent: 2007/0124015 (2007-05-01), Chen et al.
patent: 2008/0148590 (2008-06-01), Hayashi et al.
patent: 1580521 (2005-09-01), None
G F Dalgleish et al., “Laser-based inspection of cutting tools for advanced manufacturing systems,” Factory 2000—Advanced Factory Automation, Conference Publication No. 398, IEE 1994, Oct. 3-5, 1994, pp. 502-508.
EP1580521 Abstract, Sep. 28, 2005.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and system for measurement of a cutting tool does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and system for measurement of a cutting tool, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and system for measurement of a cutting tool will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2714790

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.