Radiant energy – Ionic separation or analysis – Ion beam pulsing means with detector synchronizing means
Reexamination Certificate
2006-10-24
2006-10-24
Lee, John R. (Department: 2881)
Radiant energy
Ionic separation or analysis
Ion beam pulsing means with detector synchronizing means
C250S281000, C250S282000, C250S286000, C250S288000, C250S292000
Reexamination Certificate
active
07126114
ABSTRACT:
A system and method of analyzing a sample is described. The system includes an ion source and a deflector for producing a plurality of ion beams each of which is detected in distinct detection regions. A detection system uses the information obtained from the detection region to analyze the sample.
REFERENCES:
patent: 3831026 (1974-08-01), Powers
patent: 3950641 (1976-04-01), Evans et al.
patent: 4099052 (1978-07-01), McKinney
patent: 4986990 (1991-01-01), Davidson et al.
patent: 5087815 (1992-02-01), Schultz et al.
patent: 5185161 (1993-02-01), Davidson et al.
patent: 5331158 (1994-07-01), Dowell
patent: 5426301 (1995-06-01), Turner
patent: 5614711 (1997-03-01), Li
patent: 5689111 (1997-11-01), Dresch et al.
patent: 5696375 (1997-12-01), Park et al.
patent: RE36064 (1999-01-01), Davidson et al.
patent: 6285027 (2001-09-01), Chernushevich et al.
patent: 6300626 (2001-10-01), Brock et al.
patent: 6680475 (2004-01-01), Krutchinsky
patent: 6933497 (2005-08-01), Vestal
patent: 2002/0030159 (2002-03-01), Chernushevich et al.
patent: 2003/0146392 (2003-08-01), Kimmel et a.
patent: 2004/0119012 (2004-06-01), Vestal
patent: 2005/0230614 (2005-10-01), Glukhoy
patent: 2005/0258364 (2005-11-01), Whitehouse et al.
patent: WO 99/38190 (1999-07-01), None
M. Guilhaus, “Spontaneous and Deflected Drift-Trajectories in Orthogonal Acceleration Time-of-Flight Mass Spectrometry”, 1994 American Society for Mass Spectrometry, pp. 588-595.
R.E. March, R. J. Hughes and J. F. Todd, “Quadrupole Storage Mass Spectrometry”, vol. 102 of Chemical Analysis, Wiley, 1989.
Bereskin & Parr
Lee John R.
MDS Inc.
Souw Bernard E.
LandOfFree
Method and system for mass analysis of samples does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and system for mass analysis of samples, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and system for mass analysis of samples will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3718010