Image analysis – Pattern recognition – Feature extraction
Reexamination Certificate
2011-07-19
2011-07-19
Chawan, Sheela (Department: 2624)
Image analysis
Pattern recognition
Feature extraction
C382S153000, C382S154000, C382S173000, C382S254000, C345S426000, C345S582000
Reexamination Certificate
active
07983487
ABSTRACT:
A method and system determines a 3D pose of an object in a scene. Depth edges are determined from a set of images acquired of a scene including multiple objects while varying illumination in the scene. The depth edges are linked to form contours. The images are segmented into regions according to the contours. An occlusion graph is constructed using the regions. The occlusion graph includes a source node representing an unoccluded region of an unoccluded object in scene. The contour associated with the unoccluded region is compared with a set of silhouettes of the objects, in which each silhouette has a known pose. The known pose of a best matching silhouette is selected as the pose of the unoccluded object.
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Agrawal Amit K.
Raskar Ramesh
Brinkman Dirk
Chawan Sheela
Mitsubishi Electric Research Laboratories Inc.
Vinokur Gene
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