Method and system for localizing an attenuation change...

Details Method and system for localizing an attenuation change... Method and system for localizing an attenuation change...

2008-03-20

2011-12-20

Chowdhury, Tarifur (Department: 2886)

Optics: measuring and testing

For optical fiber or waveguide inspection

C398S014000

Reexamination Certificate

active

08081306

ABSTRACT:
The invention provides a method and a system for localizing an attenuation change location in an optical waveguide, wherein the attenuation change location can be determined depending on a time difference (ΔT) between signal power change instants of optical signals having different wavelengths (λ1, λ2) that are transmitted via the optical waveguide.

REFERENCES:
patent: 5179420 (1993-01-01), So et al.
patent: 6046797 (2000-04-01), Spencer et al.
patent: 6185020 (2001-02-01), Horiuchi et al.
patent: 6879386 (2005-04-01), Shurgalin et al.
patent: 7042559 (2006-05-01), Frigo et al.
patent: 2004/0208525 (2004-10-01), Seydnejad et al.
patent: 2007/0274712 (2007-11-01), Leppla et al.
patent: 0823621 (1998-02-01), None
patent: 1796295 (2007-06-01), None
English language Abstract of EP 1796295.

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