Method and system for isolated current and voltage monitoring

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – For fault location

Reexamination Certificate

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C324S537000

Reexamination Certificate

active

07432720

ABSTRACT:
An embodiment of the invention provides a method for monitoring electrical characteristic on an electronic circuit board. This electrical characteristic can be voltage or current. The electrical characteristic is measured at a first location. The first location is at a high voltage called primary potential. The electrical characteristic is converted to a proportional frequency. The frequency is sent through an isolation circuit to a second location for monitoring. The second location is at a low voltage called secondary potential. The frequency is provided as input to an environment monitoring circuit at the second location.

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Matt Smith, “A Chip You Can Use to Monitor Environmental Conditions on PC Motherboard Designs, Analog Dialogue”, vol. 33, No. 1, On pp. 44-48, Jan. 1999.
Karrer, N. Hofer-Noser, P. , “A new current measuring principle for power electronic applications, Power Semiconductor Devices and ICs”, 1999. ISPSD '99. Proceedings., The 11th International Symposium on Publication Date: 1999. On pp. 279-282, Location: Toronto, Ont., Canada.

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