Method and system for integrated circuit RF immunity...

Telecommunications – Transmitter – Noise or interference elimination

Reexamination Certificate

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C455S067110, C455S067130, C455S425000

Reexamination Certificate

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07403749

ABSTRACT:
Method and system for enhancing RF immunity of integrated circuits (ICs). Susceptibility of different subcircuits within the IC is determined by simulation or bench testing. Relatively simple filters are implemented based on the susceptible frequency range and circuit parameters such as impedance. Filter(s) may be integrated into the IC avoiding PCB level redesign. Susceptibility determination and mitigation method may be applied to new IC designs or existing ICs without major redesign.

REFERENCES:
patent: 5337261 (1994-08-01), Rogers
patent: 6121778 (2000-09-01), Moore
patent: 6154710 (2000-11-01), Kobayashi et al.
patent: 6237126 (2001-05-01), Bonitz
patent: 6326793 (2001-12-01), Moore
patent: 6593826 (2003-07-01), See
patent: 6754598 (2004-06-01), Shimazaki et al.
patent: 7039572 (2006-05-01), Narahara et al.
patent: 7120551 (2006-10-01), Hirano et al.
patent: 7222033 (2007-05-01), Newson et al.
patent: 7278124 (2007-10-01), Shimazaki et al.
patent: 2001/0017575 (2001-08-01), See
K. Armstrong; “Analogue circuit design for RF immunity”,Australian Electronics Engineering, 2002, p. 1-4.
Coenen, M.J., “CAD EMC-design in microelectronics (finding the right balance)”,Proceedings of 10th International Zurich Symposium on Electromagnetic Compatibility, Mar. 1993, p. 6B1/25-8.
Crovetti, P.S.; Fiori, F., “Design of a CMOS opamp input stage immune to EMI”,International Journal of Electronics, 2003, vol. 90, No. 2, p. 99-108.
F. Fiori et al.; “Nonlinear effects of RF interference in MOS operational amplifiers”, IEEE 2001, p. 201-204.
Fiori, F., “Experimental evaluation of IC susceptibility to RFI”,Compliance Engineering, Mar./Apr. 2001, p. 62+64-65.
Fiori, F., “Integrated circuits immunity evaluation by different test procedures”,International Conference on Computational Electromagnetics and its Applications, 1999, p. 286-9.
Fiori, F., “ICs susceptibility: a critical assessment of the test procedures”,Fifteenth International Wroclaw Symposium and Exhibition, 2000, p. 41-4.
Franc, F., “EMI filter packaging [chip scale packaging]”,Advanced Packaging, Jul. 2002, 7 pgs.
Boris Traa; “RF-susceptibility analysis of complex integrated analog circuits”,IEEE International Symposium on Electromagnetic Compatibility, 2002; pp. 987-992.
Kyechong Kim et al.; “Study of the Effects of Microwave Interference on MOSFET Devices in CMOS Integrated Circuits”; Semiconductor Device Research Symposium, 2003 International; pp. 530-531.
N. L. Whyman et al.; “Modeling RF Interference effects in Integrated Circuits”; Electromagnetic Compatibility, 2001; EMC 2001 IEEE International Symposium on, vol. 2, pp. 1203-1208.
Franco Fiori et al.; “Investigation of VLSI's Input Ports Susceptibility to Conducted RF Interference”; Electromagnetic Compatibility, 1997; IEEE 1997 International Symposium; pp. 326-329.
F. Fiori; “Operational amplifier input stage robust to EMI”; 2001; Electronics Letters, vol. 37, pp. 930-931.
J. Gago et al.; “Instruments Offset Due to RF EMI”; Industrial Electronics Society, 2003; IECON '03 The 29th Annual Conference of the IEEE; vol. 3, pp. 2488-2493.

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