Optics: measuring and testing – Inspection of flaws or impurities
Reexamination Certificate
2005-02-10
2009-12-29
Toatley, Jr., Gregory J (Department: 2877)
Optics: measuring and testing
Inspection of flaws or impurities
C356S237200
Reexamination Certificate
active
07639349
ABSTRACT:
The method of inspecting the surface of a three-dimensional body, includes moving at least one camera and at least one illuminating device relative to the surface of the three-dimensional body, taking pictures of the areas of the surface to be inspected during the movement of the at least one camera relative to the areas of the surface to be inspected, transmitting the pictures taken to a computer and evaluating the pictures in the computer to find any defects that are present. A system for performing the method is also described. In order to obtain high inspection quality, the camera, illumination device and the surface to be inspected are brought into plural different defined geometric relationships with each other during the inspecting of each of the areas on the surface, at least for a time period required to take one picture.
REFERENCES:
patent: 2315282 (1943-03-01), Snow
patent: 4918321 (1990-04-01), Klenk et al.
patent: 5142648 (1992-08-01), Fitts et al.
patent: 5438525 (1995-08-01), Shimbara
patent: 37 12 513 (1988-11-01), None
patent: 43 38 223 (1994-05-01), None
patent: 197 39 250 (1998-03-01), None
patent: 87/00629 (1987-01-01), None
Amelung Joerg
Ersue Enis
Isra Vision System AG
Merlino Amanda H
Striker Michael J.
Toatley Jr. Gregory J
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