Method and system for inspecting microprocessor-based unit and/o

Details Method and system for inspecting microprocessor-based unit and/o Method and system for inspecting microprocessor-based unit and/o

1988-04-12

1991-08-27

Beausoliel, Robert W.

Excavating

371 24, 371 251, G06F 1130, G06F 1122

Patent

active

050439847

ABSTRACT:
An inspection device is provided an inspection parameter generator generating predetermined parameter data. The parameter data is transmitted to a control unit subjecting inspection. The inspection device receives input signal from the control unit, which input signal corresponds to the parameter data input to the control unit. Both of the control unit and inspection device processes the corresponding data. The control unit feeds resultant output to the inspection device. The inspection device compares its own resultant data and the resultant output of the control unit to make judgment whether the control unit operates in normal condition or not.

REFERENCES:
patent: 4249238 (1981-02-01), Spang
patent: 4409635 (1983-10-01), Kraus
patent: 4649537 (1989-03-01), Rosswurm
patent: 4683420 (1987-07-01), Goutzoulis

Affiliated with

Also associated with

Rating

Method and system for inspecting microprocessor-based unit and/o does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and system for inspecting microprocessor-based unit and/o, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and system for inspecting microprocessor-based unit and/o will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1420265