Method and system for inspecting integrated circuit lead burrs

Details Method and system for inspecting integrated circuit lead burrs Method and system for inspecting integrated circuit lead burrs

1996-07-25

1998-04-28

Boudreau, Leo

Image analysis

Applications

Manufacturing or product inspection

382149, G06K 900

Patent

active

057455937

ABSTRACT:
Burr inspection system (120) inspects an electrical lead for a burr (112) in association with the operation of a machine vision lead inspection system (10) and includes machine vision circuitry (50) for forming an image (70) of the electrical lead (72) using machine vision lead inspection system (10). Edge detecting instructions (120) associate with machine vision circuitry (50) for determining a plurality of edges (89, 91) associated with the electrical lead (72). Scan line determining instructions (128) calculate a plurality of scan lines (88, 90) each corresponding to the contour of a selected one of the plurality of edges (89, 91). The scan lines (88, 90) are separated from edges (88, 90) and image (70) by a preselected distance (92). Inspecting circuitry (130) inspects each scan line (88, 90) to detect whether a burr image (112) crosses the scan line (88, 90) to determine the presence of a burr on the electrical lead.

REFERENCES:
patent: 4821157 (1989-04-01), Birk et al.
patent: 4845764 (1989-07-01), Ueda et al.
patent: 4847911 (1989-07-01), Morimoto et al.
patent: 4851902 (1989-07-01), Tezuka et al.
patent: 4910598 (1990-03-01), Itakura et al.
patent: 4969198 (1990-11-01), Batchelder et al.
patent: 5119436 (1992-06-01), Holdgrafer
patent: 5250809 (1993-10-01), Nakata et al.

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