Electrophotography – Control of electrophotography process – Control of charging
Reexamination Certificate
2006-11-01
2008-11-04
Tran, Hoan H (Department: 2852)
Electrophotography
Control of electrophotography process
Control of charging
C399S043000
Reexamination Certificate
active
07447452
ABSTRACT:
The life of the photoconductor in an image forming apparatus is typically limited by the eventual occurrence of some form of print quality defect related to the photoconductor. One of the typical failure mechanisms is the slow wearing away of the surface layer of the photoconductor. Photoconductor run life is improved by operating a charging station in a low wear mode during certain circumstances, including: during printing of a low stress page as detected based on the image data; during at least one of cycle up and cycle down operations to control charging of the at least one photoconductor over at least one print zone for at least one cycle of rotation of the at least one photoconductor; during printing of at least one test patch in a process control cycle; and upon determination from the image data that at least one photoconductor will not contribute to the printing during a next print cycle.
REFERENCES:
patent: 3781105 (1973-12-01), Meagher
patent: 6611665 (2003-08-01), DiRubio et al.
patent: 6898385 (2005-05-01), Ito et al.
patent: 7054574 (2006-05-01), Facci et al.
patent: 2004/0136740 (2004-07-01), Shoji
patent: 2008/0152371 (2008-06-01), Burry et al.
Burry Aaron M.
Dirubio Christopher A.
Hamby Eric S.
Oliff & Berridg,e PLC
Tran Hoan H
Xerox Corporation
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