Data processing: structural design – modeling – simulation – and em – Modeling by mathematical expression
Reexamination Certificate
2005-08-30
2005-08-30
Broda, Samuel (Department: 2123)
Data processing: structural design, modeling, simulation, and em
Modeling by mathematical expression
C703S001000, C703S022000, C257S421000
Reexamination Certificate
active
06937967
ABSTRACT:
This invention relates to a method and system for finite element modeling of enhanced magnetoresistance in thin film semiconductors containing at least one metallic inclusion therein. The method and system utilizes finite element analysis techniques as a function of the applied magnetic field and the geometry of the device for comparing the device characteristics with predetermined qualities and modifying the device to achieve a correlation between the device characteristics and the predetermined qualities.
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Hines Daniel R.
Moussa Jonathan E.
Ram-Mohan Lakshminarayanapuram Ramdas
Solin Stuart A.
Sullivan, Jr. John M.
Broda Samuel
Scully Scott Murphy & Presser
TDK Corporation
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