Image analysis – Pattern recognition – Classification
Reexamination Certificate
2008-01-08
2008-07-29
Carter, Aaron W (Department: 2624)
Image analysis
Pattern recognition
Classification
C707S793000, C707S793000
Reexamination Certificate
active
07406200
ABSTRACT:
A method is provided clustering data points in a multidimensional dataset in a multidimensional image space that comprises generating a multidimensional image from the multidimensional dataset; generating a pyramid of multidimensional images having varying resolution levels by successively performing a pyramidal sub-sampling of the multidimensional image; identifying data clusters at each resolution level of the pyramid by applying a set of perceptual grouping constraints; and determining levels of a clustering hierarchy by identifying each salient bend in a variation curve of a magnitude of identified data clusters as a function of pyramid resolution level.
REFERENCES:
patent: 2004/0013305 (2004-01-01), Brandt et al.
patent: 2004/0202370 (2004-10-01), Fisher et al.
patent: 2007/0185946 (2007-08-01), Basri et al.
Gdalyhu et al., “Self-Organization in Vision: Stochastic Clustering for Image Segmentation, Perceptual Grouping, and Image Database Organization”, IEEE Trans. on Pattern Analysis and Machine Intelligence, Oct. 2001, pp. 1053-1074, vol. 23, No. 10.
Haas Peter J.
Lake John M.
Lohman Guy M.
Syeda-Mahmood Tanveer
Cantor & Colburn LLP
Carter Aaron W
Ngyen Van
LandOfFree
Method and system for finding structures in... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and system for finding structures in..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and system for finding structures in... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3971349