Method and system for fault testing integrated circuits using a

Details Method and system for fault testing integrated circuits using a Method and system for fault testing integrated circuits using a

1991-12-04

1995-05-30

Nguyen, Vinh

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324769, G01R 3100

Patent

active

054205220

ABSTRACT:
An improved I.sub.CCQ test method uses illumination of the integrated circuit to generate photo-induced currents and diode effects in order to detect types of circuits faults not otherwise detectable using conventional I.sub.CCQ testing methods.

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"On the Charge Sharing Problem in CMOS Stuck-Open Fault Testing", Jong Lee et al., 1990 IEEE International Test Conference, Paper 21.1-pp. 417-426.

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