Method and system for fabricating free-standing nanostructures

Semiconductor device manufacturing: process – Making passive device – Stacked capacitor

Reexamination Certificate

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C438S254000, C438S745000

Reexamination Certificate

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07008853

ABSTRACT:
Systems and methods include introducing a semiconductor wafer into a process chamber. An etching chemistry is injected into the process chamber to etch a patterned layer and to release free-standing nanostructures on the semiconductor wafer. The etching chemistry includes a supercritical or liquid carbon dioxide fluid and an etching solution. The semiconductor wafer is rinsed by flooding a supercritical or liquid carbon dioxide fluid into the process chamber. The semiconductor wafer is dried by venting out supercritical or liquid carbon dioxide fluid from the process chamber.

REFERENCES:
patent: 2004/0003828 (2004-01-01), Jackson
Legtenberg, R. et al.., “Stiction of Surface Macromachined Structures after Rinsing and Drying: Model and Investigation of Adhesion Mechanisms”, Sensors and Actuators A, 43 (1994), pp. 230-238.
Goldfarb D. et al., “Aqueous-Based Photoresist Drying Using Supercritical Carbon Dioxide to Prevent Pattern Collapse”, J. Vac.Sci. Technol. B 18(6), Nov./Dec. 2000, pp. 3313-3317.

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