Semiconductor device manufacturing: process – Making passive device – Stacked capacitor
Reexamination Certificate
2006-03-07
2006-03-07
Nelms, David (Department: 2818)
Semiconductor device manufacturing: process
Making passive device
Stacked capacitor
C438S254000, C438S745000
Reexamination Certificate
active
07008853
ABSTRACT:
Systems and methods include introducing a semiconductor wafer into a process chamber. An etching chemistry is injected into the process chamber to etch a patterned layer and to release free-standing nanostructures on the semiconductor wafer. The etching chemistry includes a supercritical or liquid carbon dioxide fluid and an etching solution. The semiconductor wafer is rinsed by flooding a supercritical or liquid carbon dioxide fluid into the process chamber. The semiconductor wafer is dried by venting out supercritical or liquid carbon dioxide fluid from the process chamber.
REFERENCES:
patent: 2004/0003828 (2004-01-01), Jackson
Legtenberg, R. et al.., “Stiction of Surface Macromachined Structures after Rinsing and Drying: Model and Investigation of Adhesion Mechanisms”, Sensors and Actuators A, 43 (1994), pp. 230-238.
Goldfarb D. et al., “Aqueous-Based Photoresist Drying Using Supercritical Carbon Dioxide to Prevent Pattern Collapse”, J. Vac.Sci. Technol. B 18(6), Nov./Dec. 2000, pp. 3313-3317.
Dupont Audrey
Hoyer Ronald
Edell Shapiro & Finnan
Hoang Quoc
Infineon - Technologies AG
Nelms David
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