Image analysis – Histogram processing – With pattern recognition or classification
Reissue Patent
2006-12-21
2011-12-06
Bhatnagar, Anand (Department: 2624)
Image analysis
Histogram processing
With pattern recognition or classification
C358S003010, C345S694000
Reissue Patent
active
RE042999
ABSTRACT:
The present invention provides a method for measuring the self-consistency of inference algorithms. The present invention provides a method for measuring the accuracy of an inference algorithm that does not require comparison to ground truth. Rather, the present invention pertains to a method for measuring the accuracy of an inference algorithm by comparing the outputs of the inference algorithm against each other. Essentially, the present invention looks at how well the algorithm applied to many of the different observations gives the same answer. In particular, the present invention provides a method that is not time and labor intensive and is cost effective.
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Davies, legal representative Margaret Frances
Fua Pascal
LeClerc Yvan G.
Luong Quang-Tuan
Bhatnagar Anand
Snell & Wilmer L.L.P.
Transpacific Kodex, LLC
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