Method and system for estimating surface plasmon resonance...

Details Method and system for estimating surface plasmon resonance... Method and system for estimating surface plasmon resonance...

2007-08-14

2010-06-15

Pham, Hoa Q (Department: 2886)

Optics: measuring and testing

Of light reflection

C356S136000, C356S243100

Reexamination Certificate

active

07738106

ABSTRACT:
A surface plasmon measurement instrument measures a change in a property (e.g., refractive index) of a material layer. The method includes providing a prism with a rear surface having a metal layer disposed thereon; providing the material layer on the metal layer on the rear surface of the prism; directing a source beam through the prism toward the rear surface in a vicinity of the material layer; performing at least two sampled measurements to detect light reflected from the rear surface and to produce two corresponding data sets; transforming the data sets to a transform domain; processing the transformed data sets to estimate a sample shift between the two data sets; and determining a change in a property of the material layer using the estimated sample shift.

REFERENCES:
patent: 5341215 (1994-08-01), Seher
patent: 6728429 (2004-04-01), Melman et al.
patent: 6734956 (2004-05-01), Byrne et al.
patent: 7233391 (2007-06-01), Schermer et al.
patent: 2007/0046943 (2007-03-01), VanWiggeren et al.
patent: 2007/0081163 (2007-04-01), Liang et al.
patent: 2008/0030736 (2008-02-01), Thrush et al.
patent: 2008/0096241 (2008-04-01), Lin et al.
patent: 2009/0141376 (2009-06-01), Smith et al.
Knut Johnson et al.; “Surface Plasmon Resonance: Instrumental Resolution using Photo Diode Arrays,” Measurement and Science Technology, vol. 11, pp. 1630-1638(2000).
Charles H. Knapp et al.; “The Generalized Correlation Method for Estimation of Time Delay,” IEEE Transactions on Acoustics, Speech and Signal Processing, vol. ASSP-24, No. 4 (Aug. 1976).

Affiliated with

Also associated with

Rating

Method and system for estimating surface plasmon resonance... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and system for estimating surface plasmon resonance..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and system for estimating surface plasmon resonance... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4158150