Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Mechanical measurement system
Patent
1997-10-20
1999-10-05
Trammell, James P.
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Mechanical measurement system
702185, 702 81, 36446817, 36446828, 382149, 382145, 438 16, 438 17, 438 5, G06F 1900, H01L 2166
Patent
active
059638818
ABSTRACT:
In a system (12) wherein articles are manufactured by a plurality of process steps (20, 22, & 24), a method for identifying causes of variations in performance of the manufactured articles is provided. The method includes tracking orientation data (48) for the articles during each of the process steps (20, 22, & 24) and then measuring (50) performance data for each of the articles. The method also includes preparing surface performance characteristic maps (54) for each of the articles from the performance data and ordering the surface performance characteristic maps (56) for each of the articles in accordance with the orientation data for each article at a given process step (20, 22, & 24).
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Kahn Randolph W.
Prosack Hank G.
Vickers Kenneth G.
Dam Tuan Q.
Denker David
Donaldson Richard L.
Holland Robby T.
Texas Instruments Incorporated
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