Method and system for electromigration analysis on signal...

Details Method and system for electromigration analysis on signal... Method and system for electromigration analysis on signal...

2011-06-28

2011-06-28

Lin, Sun J (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Integrated circuit design processing

Physical design processing

C716S112000, C716S113000, C716S136000

Reexamination Certificate

active

07971171

ABSTRACT:
The invention relates to an electromigration analysis method and a system for analyzing one or more nets in a digital integrated circuit design that are at risk of electromigration. The method comprises the steps of providing at least one interconnect between a driver cell and at least one load cell; applying same extracted netlist data for noise and/or timing analysis and for electromigration analysis; modeling the driver cell by a train of trapezoidal voltage pulses transmitted from the driver cell to the one or more load cells through the at least one interconnect; extracting at least a slew rate of a driver voltage signal and/or timing information from a noise and/or timing analysis for the one or more nets; and comparing a locally measured current density in the at least one interconnect to an effective local maximum current density limit of the at least one interconnect.

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SPICE from Wikipedia, the free encyclopedia, SPICE( simulation Program with Integrated Circuit Emphasis), http://en.wikipedia.org/wiki/SPICE.

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