Method and system for efficiently verifying optical...

Radiation imagery chemistry: process – composition – or product th – Including control feature responsive to a test or measurement

Reexamination Certificate

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C430S005000, C716S030000, C716S030000

Reexamination Certificate

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11075321

ABSTRACT:
A method of verifying optical proximity correction includes the steps of generating first mask pattern data from design data under first condition, generating first corrected pattern data by applying optical proximity correction to the first mask pattern data, generating second mask pattern data from the design data under second condition, generating second corrected pattern data by applying optical proximity correction to the second mask pattern data, and comparing the first corrected pattern data and the second corrected pattern data to check whether the first corrected pattern data and the second corrected pattern data match.

REFERENCES:
patent: 2002/0040468 (2002-04-01), Uno et al.
patent: 2002/0066069 (2002-05-01), Ashida et al.
patent: 1 199 651 (2001-10-01), None
patent: 8-160598 (1996-06-01), None
patent: 2000-155408 (2000-06-01), None
patent: 2002-107908 (2002-04-01), None
patent: 1199651 (2002-04-01), None
patent: 2002-278041 (2002-09-01), None
patent: 2002-341512 (2002-11-01), None

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