Method and system for dividing analyzing region in device simula

Details Method and system for dividing analyzing region in device simula Method and system for dividing analyzing region in device simula

1996-06-11

1997-10-07

Teska, Kevin J.

Boots, shoes, and leggings

364488, 364489, 364490, 364491, G06F 1560

Patent

active

056755228

ABSTRACT:
In order to divide an analyzing region in a semiconductor device into a plurality of fractional elements of a predetermined configuration, the analyzing region is initially divided into an arbitrary number of the fractional elements. With respect to a newly added nodal point, the fractional elements enclosing the new nodal point within a circumscribing range thereof are extracted as objective fractional elements for further division. Among the extracted fractional elements, specific fractional element having the perimetric fraction located within a predetermined modifying the perimeter of the fractional element group consisted of the extracted fractional elements. The fractional elements are re-establishes on the basis of the modified perimeter and the new nodal point.

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