Method and system for device characterization with array and...

Details Method and system for device characterization with array and... Method and system for device characterization with array and...

2006-01-24

2008-03-18

Hirshfeld, Andrew (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S762010, C324S522000, C324S073100

Reexamination Certificate

active

07345500

ABSTRACT:
A system and method for testing devices. The system includes a plurality of pads and a decoder coupled to a plurality of devices. The decoder is configured to receive a plurality of selection signals from the plurality of pads and select a device from the plurality of devices based on at least information associated with the plurality of selection signals. Additionally, the system includes one or more pads connected to the selected device. At least one of the one or more pads is not connected to any of the plurality of devices other than the selected device. The one or more pads are used for testing the selected device.

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