Method and system for determining the thickness of a layer...

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C324S229000, C204S471000

Reexamination Certificate

active

07825671

ABSTRACT:
The invention relates to electrophoretic immersion lacquering of objects, e.g. the bodies of automotive vehicles, wherein the object which is to be lacquered is immersed into lacquer immersion basin containing a lacquer fluid. An electric field is produced by the object in its capacity as an electrode with at least one counter electrode. In order to determine the thickness of the lacquer layer applied in said manner, the electric charge flowing through the object during the immersion lacquering process and the surface of the object exposed to the lacquer fluid are determined in order to determine the thickness of the lacquer layer therefrom. The thickness of the lacquer coating can thus be determined during the immersion lacquering process, resulting in fewer rejects.

REFERENCES:
patent: 3492213 (1970-01-01), Johnson
patent: 3627661 (1971-12-01), Gordon et al.
patent: 3658676 (1972-04-01), De Vittorio et al.
patent: 4452680 (1984-06-01), Jackson et al.
patent: 4851102 (1989-07-01), Inoue
patent: 5759371 (1998-06-01), Walker et al.
patent: 5914022 (1999-06-01), Lowry et al.
patent: 2003/0177978 (2003-09-01), Nobutoh et al.
patent: 1270766 (2003-01-01), None
patent: 293343 (1928-07-01), None
patent: 1203789 (1970-09-01), None
patent: 63-310996 (1988-12-01), None
patent: 1-272795 (1989-10-01), None
patent: 2-258998 (1990-10-01), None
patent: 4-165099 (1992-06-01), None
patent: 10237695 (1998-09-01), None
patent: 2000-64096 (2000-02-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and system for determining the thickness of a layer... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and system for determining the thickness of a layer..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and system for determining the thickness of a layer... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4177108

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.