Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2006-04-04
2006-04-04
Hoff, Marc S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S076000, C324S525000
Reexamination Certificate
active
07024320
ABSTRACT:
Methods, systems, and articles of manufacture consistent with the present invention provide for determining the location of a short circuit in a branched wiring system. The distance from the short circuit to an impedance measurement point is determined based on a measured impedance of the branched wiring system. The branch in which the short circuit is located is then determined by identifying a calculated high-frequency impedance phase spectrum for the branched wiring system with one of the branches short-circuited that correlates to a measured high-frequency impedance phase spectrum for the branched wiring system. The measured high-frequency impedance phase spectrum is measured from the impedance measurement point.
REFERENCES:
patent: 5587662 (1996-12-01), Kelley et al.
patent: 6442493 (2002-08-01), Jurisch et al.
patent: 6794879 (2004-09-01), Lawson et al.
Barbee Manuel L
Hoff Marc S.
Sonnenschein Nath & Rosenthal LLP
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