Method and system for determining the position of a short...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C702S076000, C324S525000

Reexamination Certificate

active

07024320

ABSTRACT:
Methods, systems, and articles of manufacture consistent with the present invention provide for determining the location of a short circuit in a branched wiring system. The distance from the short circuit to an impedance measurement point is determined based on a measured impedance of the branched wiring system. The branch in which the short circuit is located is then determined by identifying a calculated high-frequency impedance phase spectrum for the branched wiring system with one of the branches short-circuited that correlates to a measured high-frequency impedance phase spectrum for the branched wiring system. The measured high-frequency impedance phase spectrum is measured from the impedance measurement point.

REFERENCES:
patent: 5587662 (1996-12-01), Kelley et al.
patent: 6442493 (2002-08-01), Jurisch et al.
patent: 6794879 (2004-09-01), Lawson et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and system for determining the position of a short... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and system for determining the position of a short..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and system for determining the position of a short... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3620965

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.