Patent
1997-10-10
2000-01-25
Teska, Kevin J.
39550023, 3955004, G06F 1750
Patent
active
060186232
ABSTRACT:
A method and system of determining circuit performance-related characteristics, particularly delay and crosstalk, of interconnects includes defining a number of process variables which exhibit Gaussian distributions with respect to geometrical variances. A table of statistically based worst-case values representative of capacitances and resistances associated with different selections of the process variables is generated. In the preferred embodiment, the statistically based worst-case values are 3-sigma values. Also generated is a table of capacitance derivatives with respect to interconnect geometries. When a particular interconnect layout having selected process parameters is designated, the tables of 3-sigma values and derivatives are accessed to generate a resistance-capacitance (RC) net representative of the interconnect layout. The resistance and capacitance are correlated for each RC net and are partially determined by a randomized selection of values for geometries of the interconnect layout. The randomized selection of geometrical values is within the Gaussian distributions. Three-sigma delay and 3-sigma crosstalk may then be determined for the interconnect layout.
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Chang Norman H.
Kanevsky Valery
Nakagawa O. Sam
Oh Soo-Young
Garbowski Leigh Marie
Hewlett--Packard Company
Teska Kevin J.
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