Method and system for determining parameters inside a...

Details Method and system for determining parameters inside a... Method and system for determining parameters inside a...

2005-05-24

2005-05-24

McElheny, Jr., Donald (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Earth science

C702S013000

Reexamination Certificate

active

06898529

ABSTRACT:
The present invention is directed to a method and system for determining parameters inside a subterranean formation. In accordance with the present invention, a plurality of wireless data sensors are injected into the pores or fractures of a subterranean formation. The data sensors includes sensors that record parameters such as temperature, pressure and certain time stamps. Either autonoumously or upon command from a data interrogator tool located down hole, the plurality of data sensors form a wireless ad hoc network and telemeter the recorded data back to the data interrogator tool, which in turn communicates the data to a microprocessor located at the surface. Based on these data, the spatial distribution of the sensors and formation parameters such as temperature and pressure at each data sensor inside the subterranean formation can be obtained.

REFERENCES:
patent: 5276655 (1994-01-01), Rialan et al.
patent: 5652717 (1997-07-01), Miller et al.
patent: 5724241 (1998-03-01), Wood et al.
patent: 5808916 (1998-09-01), Orr et al.
patent: 5822273 (1998-10-01), Bary et al.
patent: 5991602 (1999-11-01), Sturm
patent: 6023223 (2000-02-01), Baxter, Jr.
patent: 6117643 (2000-09-01), Simpson et al.
patent: 6169476 (2001-01-01), Flanagan
patent: 6252544 (2001-06-01), Hoffberg
patent: 6285955 (2001-09-01), Goldwasser
patent: 6443228 (2002-09-01), Aronstam et al.
patent: 6519568 (2003-02-01), Harvey et al.
patent: 6751553 (2004-06-01), Young et al.
patent: 20030205376 (2003-11-01), Ayoub et al.
U.S. Appl. No. 60/374,217, filed Apr. 19, 2002.

Affiliated with

Also associated with

Rating

Method and system for determining parameters inside a... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and system for determining parameters inside a..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and system for determining parameters inside a... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3407263