Radiant energy – Invisible radiant energy responsive electric signalling – Semiconductor system
Reexamination Certificate
2006-06-06
2006-06-06
Hoff, Marc S. (Department: 2857)
Radiant energy
Invisible radiant energy responsive electric signalling
Semiconductor system
C250S339060, C716S030000
Reexamination Certificate
active
07057182
ABSTRACT:
Embodiments of the invention may reduce timing and spatial distortion in Picosecond Imaging and Circuit Analysis (PICA). In one embodiment, a method of determining distortion in a circuit image comprises: defining potential photon emission areas in the circuit image using a layout database, determining ideal photon emissions over the potential photon emission areas, measuring photon emissions for the potential photon emission areas, comparing the ideal photon emission with the measured photon emissions, and producing a mathematical model that predicts the amount of spatial distortion over the potential photon emission area.
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J. C. Tang, et al.; “Picosecond imaging circuit analysis,” IBM J. Res. Develop. vol. 44, No. 4, Jul. 2002, pp. 583-603.
C. Bolt; “Photoemission Microscopy-Advanced/Theory of Operation,” Infineon Semiconductors, pp. 213-223.
Hoff Marc S.
Robbins Janet L
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