Data processing: structural design – modeling – simulation – and em – Simulating electronic device or electrical system – Timing
Reexamination Certificate
2005-11-22
2005-11-22
Homere, Jean R. (Department: 2128)
Data processing: structural design, modeling, simulation, and em
Simulating electronic device or electrical system
Timing
C703S002000, C703S013000, C716S030000, C716S030000
Reexamination Certificate
active
06968306
ABSTRACT:
A method for determining an interconnect delay at a node in an interconnect having a plurality of nodes. The method includes performing a bottom-up tree traversal to compute the first three admittance moments for each of the nodes in the interconnect. The computed admittance moments are utilized, in an advantageous embodiment, to compute a pi-model of the downstream load. Next, the equivalent effective capacitance value Ceffis computed utilizing the components of the computed pi-model and the Elmore delay at the node under evaluation. In an advantageous embodiment, Ceffis characterized by:in-line-formulae description="In-line Formulae" end="lead"?Ceff=Cfj(1−e−T/τdj)in-line-formulae description="In-line Formulae" end="tail"?where Cfjis the far-end capacitance of the pi-model at the node, T is the Elmore delay at the node and τdj is the resistance of the pi-model (Rdj) multiplied by Cfj. The interconnect delay at the node is then determined utilizing an effective capacitance metric (ECM) delay model.
REFERENCES:
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Alpert Charles Jay
Devgan Anirudh
Kashyap Chandramouli V.
Day Herng-der
Dillon & Yudell LLP
Homere Jean R.
International Business Machines - Corporation
Salys Casimer K.
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