Method and system for determining a defect during charged...

Details Method and system for determining a defect during charged... Method and system for determining a defect during charged...

2009-03-30

2011-11-29

Lauchman, Layla (Department: 2877)

Image analysis

Applications

Manufacturing or product inspection

C250S310000

Reexamination Certificate

active

08068662

ABSTRACT:
A method for determining a defect during charged particle beam inspection of a sample locates at least one examination region within a charged particle microscopic image of the sample by making reference to a database graphic of the sample corresponding to the charged particle microscopic image. Each located examination region concerns at least one element of the sample, and each element has at least one characteristic in common. At least one point response value is then generated for each point in the located examination regions. The presence of a defect at the location of the concerned point is then determined by applying at least one decision tree operator to the generated point response values of the concerned point. Applications of the proposed method as a computing agent and a charged particle beam inspection system are also disclosed.

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